Fummi, F.: search on Z-Library

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1

The role of indigenous knowledge in drought risk reduction: A case of communal farmers in South Africa

Muyambo, Fummi, Bahta, Yonas T., Jordaan, Andries J.

Journal:

Jàmbá Journal of Disaster Risk Studies

Year:

2017

Language:

english

File:

PDF, 2.58 MB

english, 2017

2

[IEEE 2020 25th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) - Vienna, Austria (2020.9.8-2020.9.11)] 2020 25th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) - The Design of a Digital-Twin for Predictive Maintenance

Centomo, Stefano, Dall'Ora, Nicola, Fummi, Franco

Year:

2020

File:

PDF, 700 KB

2020

3

Automatic Generation of Analog/Mixed Signal Virtual Platforms for Smart Systems

Fraccaroli, Enrico, Lora, Michele, Fummi, Franco

Journal:

IEEE Transactions on Computers

Year:

2020

Language:

english

File:

PDF, 881 KB

english, 2020

4

Analog Models Manipulation for Effective Integration in Smart System Virtual Platforms

Lora, Michele, Vinco, Sara, Fraccaroli, Enrico, Quaglia, Davide, Fummi, Franco

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2017

Language:

english

File:

PDF, 1.86 MB

english, 2017

5

[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - Panel: Future SoC verification methodology: UVM evolution or revolution?

Drechsler, Rolf, Chevallaz, Christophe, Fummi, Franco, Hu, Alan J., Morad, Ronny, Schirrmeister, Frank, Goryachev, Alex

Year:

2014

Language:

english

File:

PDF, 250 KB

english, 2014

6

HDL code generation from UML/MARTE sequence diagrams for verification and synthesis

Ebeid, Emad, Fummi, Franco, Quaglia, Davide

Journal:

Design Automation for Embedded Systems

Year:

2015

Language:

english

File:

PDF, 3.84 MB

english, 2015

7

FAST: An RTL Fault Simulation Framework based on RTL-to-TLM Abstraction

Nicola Bombieri, Franco Fummi, Valerio Guarnieri

Journal:

Journal of Electronic Testing

Year:

2012

Language:

english

File:

PDF, 1.47 MB

english, 2012

8

[IEEE Comput. Soc. Press the European Design and Test Conference. ED&TC 1995 - Paris, France (6-9 March 1995)] Proceedings the European Design and Test Conference. ED&TC 1995 - Sequential logic minimization based on functional testability

Fummi, F., Sciuto, D., Serra, M.

Year:

1995

Language:

english

File:

PDF, 528 KB

english, 1995

9

[IEEE 2002 IEEE International Symposium on Circuits and Systems - Phoenix-Scottsdale, AZ, USA (26-29 May 2002)] 2002 IEEE International Symposium on Circuits and Systems. Proceedings (Cat. No.02CH37353) - A combined approach to validate the design of embedded network devices

Martignano, M., Drago, N., Fummi, F., Martini, S.

Year:

2002

Language:

english

File:

PDF, 457 KB

english, 2002

10

Synthesis for testability of highly complex controllers by functional redundancy removal

Fummi, F., Sciuto, D., Serra, M.

Journal:

IEEE Transactions on Computers

Year:

1999

Language:

english

File:

PDF, 1.39 MB

english, 1999

11

[IEEE 2006 Ph.D. Research in Microelectronics and Electronics - Otranto, Italy (12-15 June 2006)] 2006 Ph.D. Research in Microelectronics and Electronics - A TLM Design for Verification Methodology

Bombieri, N., Fummi, F., Pravadelli, G.

Year:

2006

Language:

english

File:

PDF, 412 KB

english, 2006

12

[IEEE Comput. Soc. Press International Conference on Computer Design. VLSI in Computers and Processors - Austin, TX, USA (7-9 Oct. 1996)] Proceedings International Conference on Computer Design. VLSI in Computers and Processors - Implicit test sequences compaction for decreasing test application cost

Bevacqua, R., Ferrandi, F., Fummi, F., Guerrazzi, L.

Year:

1996

Language:

english

File:

PDF, 696 KB

english, 1996

13

[IEEE 2011 IEEE International Symposium on Circuits and Systems (ISCAS) - Rio de Janeiro, Brazil (2011.05.15-2011.05.18)] 2011 IEEE International Symposium of Circuits and Systems (ISCAS) - Communication-aware design flow for dependable networked embedded systems

Fummi, F., Quaglia, D., Stefanni, F.

Year:

2011

Language:

english

File:

PDF, 254 KB

english, 2011

14

Syndrome de sevrage aux benzodiazépines ou apparentés au cours d’une hospitalisation, à propos de 22 cas

Thorel, Marine, Fummi, Camille, Gras, Valérie, Masmoudi, Kamel

Journal:

Year:

2016

File:

PDF, 401 KB

2016

15

Simulation alternatives for the verification of networked cyber-physical systems

Lora, Michele, Muradore, Riccardo, Quaglia, Davide, Fummi, Franco

Journal:

Microprocessors and Microsystems

Year:

2015

Language:

english

File:

PDF, 1.36 MB

english, 2015

16

[IEEE 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Grenoble, France (2020.3.9-2020.3.13)] 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Production Recipe Validation through Formalization and Digital Twin Generation

Spellini, Stefano, Chirico, Roberta, Panato, Marco, Lora, Michele, Fummi, Franco

Year:

2020

File:

PDF, 842 KB

2020

17

[IEEE Comput. Soc. Press EUROMICRO 96. 22nd Euromicro Conference. Beyond 2000: Hardware and Software Design Strategies - Prague, Czech Republic (2-5 Sept. 1996)] Proceedings of EUROMICRO 96. 22nd Euromicro Conference. Beyond 2000: Hardware and Software Design Strategies - SCAN/BIST techniques for decreasing test storage and their implications to test pattern generation

Bevacqua, R., Guerrazzi, L., Fummi, F.

Year:

1995

Language:

english

File:

PDF, 803 KB

english, 1995

18

Automatic Abstraction of RTL IPs into Equivalent TLM Descriptions

Bombieri, N., Fummi, F., Pravadelli, G.

Journal:

IEEE Transactions on Computers

Year:

2011

Language:

english

File:

PDF, 1.02 MB

english, 2011

19

Testing core-based systems: a symbolic methodology

Ferrandi, F., Fummi, F., Sciuto, D., Macii, E., Poncino, M.

Journal:

IEEE Design & Test of Computers

Year:

1997

Language:

english

File:

PDF, 152 KB

english, 1997

20

[IEEE 2011 16th IEEE European Test Symposium (ETS) - Trondheim, Norway (2011.05.23-2011.05.27)] 2011 Sixteenth IEEE European Test Symposium - Accelerating RTL Fault Simulation through RTL-to-TLM Abstraction

Bombieri, N., Fummi, F., Guarnieri, V.

Year:

2011

Language:

english

File:

PDF, 436 KB

english, 2011

21

[IEEE 2002 IEEE International Symposium on Circuits and Systems - Phoenix-Scottsdale, AZ, USA (26-29 May 2002)] 2002 IEEE International Symposium on Circuits and Systems. Proceedings (Cat. No.02CH37353) - A fault tolerant incremental design methodology

Cailotto, S., Fin, A., Fummi, F.

Year:

2002

Language:

english

File:

PDF, 376 KB

english, 2002

22

[IEEE 2018 IEEE International Symposium on Circuits and Systems (ISCAS) - Florence, Italy (2018.5.27-2018.5.30)] 2018 IEEE International Symposium on Circuits and Systems (ISCAS) - A Framework for the Design and Simulation of Embedded Vision Applications Based on OpenVX and ROS

Aldegheri, Stefano, Bombieri, Nicola, Dall'Ora, Nicola, Fummi, Franco, Girardi, Simone, Panato, Marco

Year:

2018

Language:

english

File:

PDF, 483 KB

english, 2018

23

[IEEE 2018 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC) - Verona, Italy (2018.10.8-2018.10.10)] 2018 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC) - Cyber-Physical Systems Integration in a Production Line Simulator

Centomo, Stefano, Panato, Marco, Fummi, Franco

Year:

2018

Language:

english

File:

PDF, 25 KB

english, 2018

24

[IEEE 2020 57th ACM/IEEE Design Automation Conference (DAC) - San Francisco, CA, USA (2020.7.20-2020.7.24)] 2020 57th ACM/IEEE Design Automation Conference (DAC) - Late Breaking Results: Enabling Containerized Computing and Orchestration of ROS-based Robotic SW Applications on Cloud-Server-Edge Architectures

Aldegheri, Stefano, Bombieri, Nicola, Fummi, Franco, Girardi, Simone, Muradore, Riccardo, Piccinelli, Nicola

Year:

2020

File:

PDF, 1.25 MB

2020

25

[Lecture Notes in Electrical Engineering] Languages, Design Methods, and Tools for Electronic System Design Volume 454 || Feature-Based State Space Coverage Metric for Analog Circuit Verification

Fummi, Franco, Wille, Robert

Year:

2018

Language:

english

File:

PDF, 2.25 MB

english, 2018

26

[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - Panel: Future SoC verification methodology: UVM evolution or revolution?

Drechsler, Rolf, Chevallaz, Christophe, Fummi, Franco, Hu, Alan J., Morad, Ronny, Schirrmeister, Frank, Goryachev, Alex

Year:

2014

Language:

english

File:

PDF, 250 KB

english, 2014

27

[IEEE 2019 IEEE 8th International Workshop on Advances in Sensors and Interfaces (IWASI) - Otranto, Italy (2019.6.13-2019.6.14)] 2019 IEEE 8th International Workshop on Advances in Sensors and Interfaces (IWASI) - Industrial-IoT Data Analysis Exploiting Electronic Design Automation Techniques

Dall'Ora, Nicola, Centomo, Stefano, Fummi, Franco

Year:

2019

Language:

english

File:

PDF, 6.58 MB

english, 2019

28

[IEEE 2010 IEEE International High Level Design Validation and Test Workshop (HLDVT) - Anaheim, FL, USA (2010.06.10-2010.06.12)] 2010 IEEE International High Level Design Validation and Test Workshop (HLDVT) - Semi-formal functional verification by EFSM traversing via NuSMV

Di Guglielmo, Giuseppe, Fummi, Franco, Pravadelli, Graziano, Soffia, Stefano, Roveri, Marco

Year:

2010

Language:

english

File:

PDF, 561 KB

english, 2010

29

[IEEE 2010 18th IEEE/IFIP International Conference on VLSI and System-on-Chip (VLSI-SoC) - Madrid, Spain (2010.09.27-2010.09.29)] 2010 18th IEEE/IFIP International Conference on VLSI and System-on-Chip - Model checking on TLM-2.0 IPs through automatic TLM-to-RTL synthesis

Bombieri, Nicola, Fummi, Franco, Guarnieri, Valerio

Year:

2010

Language:

english

File:

PDF, 299 KB

english, 2010

30

[IEEE 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - Dresden (2010.03.8-2010.03.12)] 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - RTOS-aware refinement for TLM2.0-based HW/SW designs

Becker, Markus, Di Guglielmo, Giuseppe, Fummi, Franco, Mueller, Wolfgang, Pravadelli, Graziano, Tao Xie,

Year:

2010

Language:

english

File:

PDF, 164 KB

english, 2010

31

[IEEE 2019 IEEE 17th International Conference on Industrial Informatics (INDIN) - Helsinki, Finland (2019.7.22-2019.7.25)] 2019 IEEE 17th International Conference on Industrial Informatics (INDIN) - A Contract-based Methodology for Production Lines Validation

Chirico, Roberta, Spellini, Stefano, Panato, Marco, Lora, Michele, Fummi, Franco

Year:

2019

File:

PDF, 335 KB

2019

32

[IEEE 2012 13th International Workshop on Microprocessor Test and Verification (MTV) - Austin, TX, USA (2012.12.10-2012.12.13)] 2012 13th International Workshop on Microprocessor Test and Verification (MTV) - Redesign and Verification of RTL IPs through RTL-to-TLM Abstraction and TLM Synthesis

Bombieri, Nicola, Fummi, Franco, Guarnieri, Valerio, Pravadelli, Graziano, Vinco, Sara

Year:

2012

Language:

english

File:

PDF, 489 KB

english, 2012

33

Reuse and optimization of testbenches and properties in a TLM-to-RTL design flow

Bombieri, Nicola, Fummi, Franco, Pravadelli, Graziano

Journal:

ACM Transactions on Design Automation of Electronic Systems

Year:

2008

Language:

english

File:

PDF, 527 KB

english, 2008

34

SystemC co-simulation for core-based embedded systems

Franco Fummi, Mirko Loghi, Giovanni Perbellini, Massimo Poncino

Journal:

Design Automation for Embedded Systems

Year:

2007

Language:

english

File:

PDF, 721 KB

english, 2007

35

[IEEE 2013 11th East-West Design and Test Symposium (EWDTS) - Rostov-on-Don, Russia (2013.09.27-2013.09.30)] East-West Design & Test Symposium (EWDTS 2013) - RTL IP abstraction into optimized embedded software

Bombieri, Nicola, Forrini, Diego, Fummi, Franco, Laurenzi, Matteo, Vinco, Sara

Year:

2013

Language:

english

File:

PDF, 323 KB

english, 2013

36

[IEEE 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. - Cannes, France (10-13 Oct. 2004)] 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. - At-speed functional verification of programmable devices

Bombieri, N., Fummi, F., Pravadelli, G.

Year:

2004

Language:

english

File:

PDF, 299 KB

english, 2004

37

[IEEE Proceedings. Ninth IEEE European Test Symposium, 2004. ETS 2004. - Corsica, France (23-26 May 2004)] Proceedings. Ninth IEEE European Test Symposium, 2004. ETS 2004. - Functional fault coverage: the chamber of secrets or an accurate estimation of gate-level coverage?

Fummi, F., Marconcini, C., Pravadelli, G.

Year:

2004

Language:

english

File:

PDF, 357 KB

english, 2004

38

[IEEE IEEE International Conference on Computer Design: VLSI in Computers and Processors, 2004. ICCD 2004. Proceedings. - San Jose, CA, USA (11-13 Oct. 2004)] IEEE International Conference on Computer Design: VLSI in Computers and Processors, 2004. ICCD 2004. Proceedings. - Software/network co-simulation of heterogeneous industrial networks architectures

Fummi, F., Martini, S., Monguzzi, M., Perbellini, G., Poncino, M.

Year:

2004

Language:

english

File:

PDF, 364 KB

english, 2004

39

[IEEE Design, Automation & Test in Europe Conference - Nice, France (2007.04.16-2007.04.20)] 2007 Design, Automation & Test in Europe Conference & Exhibition - Incremental ABV for Functional Validation of TL-to-RTL Design Refinement

Bombieri, Nicola, Fummi, Franco, Pravadelli, Graziano

Year:

2007

Language:

english

File:

PDF, 243 KB

english, 2007

40

[IEEE 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - Dresden (2010.03.8-2010.03.12)] 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - Vacuity analysis for property qualification by mutation of checkers

Di Guglielmo, Luigi, Fummi, Franco, Pravadelli, Graziano

Year:

2010

Language:

english

File:

PDF, 189 KB

english, 2010

41

[IET 2010 Forum on Specification & Design Languages (FDL 2010) - Southampton, UK (14-16 Sept. 2010)] 2010 Forum on Specification & Design Languages (FDL 2010) - Modeling of communication infrastructure for design-space exploration

Fummi, F., Lovato, G., Quaglia, D., Stefanni, F.

Year:

2010

Language:

english

File:

PDF, 151 KB

english, 2010

42

[ACM Press the 50th Annual Design Automation Conference - Austin, Texas (2013.05.29-2013.06.07)] Proceedings of the 50th Annual Design Automation Conference on - DAC '13 - A method to abstract RTL IP blocks into C++ code and enable high-level synthesis

Bombieri, Nicola, Liu, Hung-Yi, Fummi, Franco, Carloni, Luca

Year:

2013

Language:

english

File:

PDF, 885 KB

english, 2013

43

[IEEE 2014 10th International Conference on Advanced Semiconductor Devices & Microsystems (ASDAM) - Smolenice, Slovakia (2014.10.20-2014.10.22)] The Tenth International Conference on Advanced Semiconductor Devices and Microsystems - Homogeneous simulation: The effective integration solution for smart systems

Fummi, F., Lora, M., Trachanis, D., Van Hese, J., Vinco, S.

Year:

2014

Language:

english

File:

PDF, 271 KB

english, 2014

44

[ACM Press the great lakes symposium - Salt Lake City, Utah, USA (2012.05.03-2012.05.04)] Proceedings of the great lakes symposium on VLSI - GLSVLSI '12 - On the automatic synthesis of parallel SW from RTL models of hardware IPs

Acquaviva, Andrea, Bombieri, Nicola, Fummi, Franco, Vinco, Sara

Year:

2012

Language:

english

File:

PDF, 524 KB

english, 2012

45

[IEEE 2014 15th International Microprocessor Test and Verification Workshop (MTV) - Austin, TX, USA (2014.12.15-2014.12.16)] 2014 15th International Microprocessor Test and Verification Workshop - Hardware Synthesis from Software-Oriented UML Descriptions

Lora, Michele, Martinelli, Francesco, Fummi, Franco

Year:

2014

Language:

english

File:

PDF, 882 KB

english, 2014

46

[St. Petersburg State Polytech. Univ ICCSC 2002 - 1st International Conference on Circuits and Systems for Communications - St. Petersburg, Russia (26-28 June 2002)] ICCSC'02. 1st IEEE International Conference on Circuits and Systems for Communications. Proceedings (IEEE Cat. No.02EX605) - Modeling network embedded systems with NS-2 and SystemC

Drago, N., Fummi, F., Poncino, M.

Year:

2002

Language:

english

File:

PDF, 568 KB

english, 2002

47

[IEEE 2016 17th Latin-American Test Symposium (LATS) - Foz do Iguacu, Brazil (2016.4.6-2016.4.8)] 2016 17th Latin-American Test Symposium (LATS) - A SystemC-based platform for assertion-based verification and mutation analysis in systems biology

Coati, Daniele, Distefano, Rosario, Bombieri, Nicola, Fummi, Franco, Mirenda, Michela, Laudanna, Carlo, Giugno, Rosalba

Year:

2016

Language:

english

File:

PDF, 1.97 MB

english, 2016

48

Too Few or Too Many Properties? Measure it by ATPG!

Franco Fummi, Graziano Pravadelli

Journal:

Journal of Electronic Testing

Year:

2007

Language:

english

File:

PDF, 500 KB

english, 2007

49

[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - Moving from co-simulation to simulation for effective smart systems design

Fummi, Franco, Lora, Michele, Stefanni, Francesco, Trachanis, Dimitrios, Vanhese, Jahn, Vinco, Sara

Year:

2014

Language:

english

File:

PDF, 435 KB

english, 2014

50

[IEEE Comput. Soc. Press 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems - Venice, Italy (27-29 Oct. 1993)] Proceedings of 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems - Fault detection in sequential circuits through functional testing

Buonanno, G., Fummi, F., Sciuto, D.

Year:

1993

Language:

english

File:

PDF, 609 KB

english, 1993

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